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NXP Semiconductors
IP4352CX24
9-channel SD memory card interface filter with ESD protection
Table 5. Frequency response
T amb = 25 ° C; unless otherwise specified.
Symbol Parameter
α il
insertion loss
Conditions
all channels; R gen = 50 Ω ; R L = 50 Ω
Min
Typ
Max Unit
f < 400 MHz
400 MHz < f < 800 MHz
800 MHz < f < 2.5 GHz
2.5 GHz < f < 6 GHz
-
9
13
28
-
-
-
32
9
-
-
-
dB
dB
dB
dB
Table 6. Time domain response
Measured using source with 0 V to 3 V steps and 20 % to 70 % LOW-to-HIGH limits; T amb = 25 ° C;
unless otherwise specified.
Symbol Parameter
Conditions
Min
Typ
Max Unit
High speed R gen = 50 Ω ; t r = t f = 2 ns [1]
t r
t f
rise time
fall time
R L = 20 pF || 100 k Ω
R L = 40 pF || 100 k Ω
R L = 20 pF || 100 k Ω
R L = 40 pF || 100 k Ω
-
-
-
-
3.2
4.4
3.3
5.5
3.7
6
4.3
7.5
ns
ns
ns
ns
[1]
Performed on all high speed lines (channels including R1 to R9, see Figure 2 ).
7. Application information
7.1 Insertion loss
The insertion loss was measured with a test PCB utilizing laser-drilled micro-via holes
which connect the PCB ground plane to the ground pins.
The configuration for measuring insertion loss in a 50 Ω system is shown in Figure 3 .
IN
50 Ω
DUT
OUT
50 Ω
TEST BOARD
Vgen
001aai755
Fig 3.
Frequency response measurement configuration
The frequency response curves measured on pins A1 and A4, E1 and E4 and C2 and C4
at frequencies up to 3 GHz are shown in Figure 4 .
IP4352CX24_2
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 02 — 3 May 2010
? NXP B.V. 2010. All rights reserved.
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